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Industry Perspective · Ron Schneiderman,
Contributing Editor
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Industry Perspective · Jeff Shepard,
Contributing Editor
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Industry Perspective · Tom Curatolo,
Contributing Editor
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Industry Perspective · Frank
Schirrmeister, Contributing Editor
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Industry Perspective · Linley Gwennap, The
Linley Group
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Industry Perspective · Laurie Balch, Gary
Smith EDA
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Industry Perspective · Ray Alderman,
VITA
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Industry Perspective · Michael Barr,
Netrino
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Industry Perspective · Sivakumar
Narayanaswamy, Frost & Sullivan
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Industry Perspective · Richard McDonnell,
National Instruments
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Technology Report · Don Tuite,
Analog/Power Editor
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Technology Report · Louis E. Frenzel,
Communications Editor
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Technology Report · Mat Dirjish,
Components Editor
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Technology Report · Bill Wong,
Embedded/Systems/Software Editor
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Technology Report · David Maliniak,
EDA/Test Editor
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Technology Report · Bill Wong,
Embedded/Systems/Software Editor
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Technology Report · Roger Allan,
Contributing Editor
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Technology Report · Francoise Von Trapp,
Contributing Editor
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Technology Report · Don Tuite,
Analog/Power Editor
|
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Technology Report · David Maliniak,
EDA/Test Editor
|
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Editorial · Joseph Desposito,
Editor-in-Chief
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Pease Porridge · Bob Pease
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