ED_TOC Penton Media January 14, 2010 If you want to view this on the web go to: http://enews.penton.com/enews/electronicdesign/v/1030 ---------------------------------------- ADVERTISEMENT (http://www.jtaglive.com/lp/ElDes) New Approach to PCB Hardware Debug Overcomes Access Problems (http://www.jtaglive.com/lp/ElDes) JTAG Live™ solves access problems on crowded hardware prototypes. Probe, check continuity, and measure circuit response with the free, easy Buzz app without requiring access to physical test points. Use add-on low-cost Clip and Script apps to measure multiple signals and complex clusters. Compatible with popular cables from Altera, Xilinx, and JTAG Technologies. More product info available here. (http://www.jtaglive.com/lp/ElDes) JTAG Live -- making JTAG accessible. A product of JTAG Technologies. ---------------------------------------- FEATURES --HR Execs Say The 2010 Job Market Will Be A Mixed Bag Industry Perspective · Ron Schneiderman, Contributing Editor To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=hr_execs_say_the_2010_job_market_will_be_a_mixed_bag&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --DC Power Distribution Advances In The Pacific Rim Industry Perspective · Jeff Shepard, Contributing Editor To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=dc_power_distribution_advances_in_the_pacific_rim&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 ---------------------------------------- ADVERTISEMENT Debugging Prototype Hardware with a Simple, Low-cost Tool (http://www.jtaglive.com/lp/ElDes) Download JTAG Live™ (http://www.jtaglive.com/lp/ElDes) and get started debugging your prototypes right away. No netlist needed and no physical probing of test points. JTAG Live overcomes difficult access problems on crowded boards. The FREE Buzz app helps you probe, check continuity, and measure circuit response. Add-on low-cost Clip and Script apps measure multiple signals and complex clusters. Compatible with popular cables from Altera, Xilinx, and JTAG Technologies. JTAG Live -- making JTAG accessible. A product of JTAG Technologies. ---------------------------------------- --The Market Speaks And The People Listen... And Vice Versa Industry Perspective · Tom Curatolo, Contributing Editor To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=the_market_speaks_and_the_people_listen_and_vice_versa&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --2010 Will Change The Balance In Verification Industry Perspective · Frank Schirrmeister, Contributing Editor To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=2010_will_change_the_balance_in_verification&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --Mobile Chips Evolve To Handle Demands Of Smart-Phone Features Industry Perspective · Linley Gwennap, The Linley Group To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=mobile_chips_evolve_to_handle_demands_of_smart_phone_features&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --EDA Sputters Along, But Hopefully Better Days Lie Ahead In 2010 Industry Perspective · Laurie Balch, Gary Smith EDA To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=eda_sputters_along_but_hopefully_better_days_lie_ahead_in_2010&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --2010 Looks Good For VME, VXS, And VPX In Military And Aerospace Industry Perspective · Ray Alderman, VITA To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=2010_looks_good_for_vme_vxs_and_vpx_in_military_and_aerospace&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --Faulty Code Will Lead To An Era Of Firmware-Related Litigation Industry Perspective · Michael Barr, Netrino To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=faulty_code_will_lead_to_an_era_of_firmware_related_litigation&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --Emerging Technologies Offer Opportunities For The T&M Industry Industry Perspective · Sivakumar Narayanaswamy, Frost & Sullivan To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=emerging_technologies_offer_opportunities_for_the_t_m_industry&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --The Information Age Drives COTS Technologies For Automated Test Industry Perspective · Richard McDonnell, National Instruments To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=the_information_age_drives_cots_technologies_for_automated_test&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --Three Industry Chip Leaders Track Analog Chip Trends Technology Report · Don Tuite, Analog/Power Editor To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=three_industry_leaders_track_analog_chip_trends&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --The Communications Market Will Survive The Downturn Technology Report · Louis E. Frenzel, Communications Editor To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=the_communications_market_will_survive_the_downturn&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --Power And Display OEMs Will Woodshed In 2010 Technology Report · Mat Dirjish, Components Editor To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=power_and_display_oems_will_woodshed_in_2010&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --Get Ready for Low Power And More Multicore In 2010 Technology Report · Bill Wong, Embedded/Systems/Software Editor To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=get_ready_for_low_power_and_more_multicore_in_2010&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --Verification And Software Dominate EDA's Future Technology Report · David Maliniak, EDA/Test Editor To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=verification_and_software_dominate_eda_s_future&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --Expect Even More Options For Embedded Designs Technology Report · Bill Wong, Embedded/Systems/Software Editor To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=expect_even_more_options_for_embedded_designs&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --MEMS And Nano Push For Higher System Integration Levels Technology Report · Roger Allan, Contributing Editor To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=mems_and_nano_push_for_higher_system_integration_levels&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --The Future Looks Bright For 3D Integration Technology Report · Francoise Von Trapp, Contributing Editor To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=the_future_looks_bright_for_3d_integration&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --For Power Design Opportunities, Try The Smart Grid Technology Report · Don Tuite, Analog/Power Editor To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=for_power_design_opportunities_try_the_smart_grid&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 --Test Equipment Seeks To Stay Ahead Of The Curve Technology Report · David Maliniak, EDA/Test Editor To view the full article go to: http://electronicdesign.com/tabid/57/default.aspx?topic=test_equipment_seeks_to_stay_ahead_of_the_curve&catpath=&fltrTitle=&fltrSummary=&fltrPublication=?nl=1 COLUMNS --Woz Never Fails To Fascinate As He Discusses The Future Editorial · Joseph Desposito, Editor-in-Chief To view the full article go to: http://electronicdesign.com/article/digital/woz_never_fails_to_fascinate_as_he_discusses_the_future.aspx?nl=1 --What's All This Leopard Stuff, Anyhow? Pease Porridge · Bob Pease To view the full article go to: http://electronicdesign.com/article//page/1/what_s_all_this_leopard_stuff_anyhow_.aspx?nl=1 ---------------------------------------- JTAG Technologies (http://www.jtaglive.com/lp/ElDes) ---------------------------------------- ---------------------------------------- Subscribe To Electronic Design http://electronicdesign.com/Subscribe/ ---------------------------------------- ---------------------------------------- Read White Paper: Design Considerations for Maximizing Throughput and Accuracy in Switch/Measure Instrumentation Brought to you by Keithley Instruments, Inc. Read now! http://www.accelacomm.com/jaw/enewsrightrail/9/50732664/ Read White Paper: Achieving Accurate and Reliable Resistance Measurements in Low Power and Low Voltage Applications Brought to you by Keithley Instruments, Inc. 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